Investigation of the Statistical surface morphology and optical properties of the Ag/Al and Ag/Cu thin double-layers

In this work, thin films were deposited on the amorphous glass substrates by magnetron sputtering method. Surface morphology of double-layers of Ag/Al and Ag/Cu were investigated. For surface morphology studies atomic force microscope (AFM) and scanning electron microscopy (SEM) were used, variations of the grain and partical size as well as surface roughness, roughness exponents and correlation length were studied for double layers. Coating Cu and Al on silver thin films reduces the surface roughness and correlation length but when Ag is deposited on Al and Cu correlation length increases. The reflectance is measured in wavelength range of 200-1100 nm, and deposition of Cu and Al thin films on Ag film causes variation on the amount of the reflectance drastically.